<?xml version="1.0" encoding="UTF-8"?>
<collection xmlns="http://www.loc.gov/MARC21/slim">
  <record>
    <leader>00000nam  2200000   4500</leader>
    <controlfield tag="001">INLIS000000000018837</controlfield>
    <controlfield tag="005">20241218113017</controlfield>
    <datafield tag="035" ind1="#" ind2="#">
      <subfield code="a">0010-1224000208</subfield>
    </datafield>
    <controlfield tag="007">ta</controlfield>
    <controlfield tag="008">241218################g##########0#ind##</controlfield>
    <datafield tag="020" ind1="#" ind2="#">
      <subfield code="a">0-07-004230-5</subfield>
    </datafield>
    <datafield tag="082" ind1="#" ind2="#">
      <subfield code="a">621.381.5</subfield>
    </datafield>
    <datafield tag="084" ind1="#" ind2="#">
      <subfield code="a">621.381.5 BEC d</subfield>
    </datafield>
    <datafield tag="100" ind1=" " ind2="#">
      <subfield code="a">Becker, Peter W.</subfield>
    </datafield>
    <datafield tag="245" ind1="1" ind2="#">
      <subfield code="a">Design Of Systems and Circuits :</subfield>
      <subfield code="b">for maximum reliability of maximum production yield /</subfield>
      <subfield code="c">Peter W. Becker dan Finn Jensen</subfield>
    </datafield>
    <datafield tag="260" ind1="#" ind2="#">
      <subfield code="a">Amerika :</subfield>
      <subfield code="b">McGraw-Hill Book Company,</subfield>
      <subfield code="c">1977</subfield>
    </datafield>
    <datafield tag="300" ind1="#" ind2="#">
      <subfield code="a">xiii, 293 hlm. :</subfield>
      <subfield code="b">ill. ;</subfield>
      <subfield code="c">23 cm</subfield>
    </datafield>
    <datafield tag="650" ind1="#" ind2="4">
      <subfield code="a">Design Of Systems and Circuits</subfield>
    </datafield>
    <datafield tag="520" ind1="#" ind2="#">
      <subfield code="a">The material presented in this book falls naturally into three parts. The first part, Chap.1 through 4, introduces the problem of optimization of yield or drift reliability (Chap 1) and gives a brief account of some basic reliability concepts (chap.2). Chapter 3 is concerned with the discipline of design.</subfield>
    </datafield>
    <datafield tag="990" ind1="#" ind2="#">
      <subfield code="a">16820</subfield>
    </datafield>
  </record>
</collection>
